We use cookies or similar technologies as specified in our privacy policy to enhance your experience. If you would like to learn more about how we use cookies, click "Cookie Policy".
연구ᆞ표면분석용 원자현미경
Small Sample AFM
We redefine precision in nanoscale exploration with its range of Small Sample Atomic Force Microscopes, crucial for research involving compact samples typically under 100 mm x 100 mm. These AFMs are integral to advancing scientific understanding across diverse disciplines, from material science to nanoelectronics. We incorporate its core AFM technologies into each of its Small Sample AFMs, ensuring unmatched accuracy, the benefits of non-contact scanning, and user-friendly operation. The suite of small-sample AFMs offers tailored solutions that align with specific research requirements, environments, and financial considerations. This range of Park atomic force microscopes facilitates detailed surface imaging, and accurate and high-resolution measurements at the nanoscale.